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dc.contributor.author
Bühlmann, Pascal
dc.contributor.author
Schenk, Daniel
dc.contributor.author
Mazza, Edoardo
dc.contributor.author
Franck, Christian
dc.date.accessioned
2019-06-28T06:28:03Z
dc.date.available
2019-06-26T17:58:50Z
dc.date.available
2019-06-27T05:57:46Z
dc.date.available
2019-06-28T06:28:03Z
dc.date.issued
2019-06
dc.identifier.issn
2426-1335
dc.identifier.uri
http://hdl.handle.net/20.500.11850/349991
dc.identifier.doi
10.3929/ethz-b-000349991
dc.description.abstract
Overhead line conductors are tensioned to fulfill sag limitations. Free-span conditions of common conductors are investigated and documented in literature. In this paper, the structural changes of an all aluminum alloy overhead line conductor near a wedge tension clamp are investigated by x-ray tomography, digital image correlation and finite element analysis. The results achieved with these three methods consistently show that the inner layers of the conductor are slipping relative to the outer layers of the conductor. Additionally, not all wires on the same layer are clamped equally. Thus, there is a mechanical transition zone of approximately 300 mm between the tension clamp and the free-span. This mechanical transition zone and the associated structural changes of the conductor are measured and modeled. The tools used in this study can be applied on other conductors and clamps as well.
en_US
dc.format
application/pdf
en_US
dc.language.iso
en
en_US
dc.publisher
CIGRE
en_US
dc.rights.uri
http://rightsstatements.org/page/InC-NC/1.0/
dc.subject
All aluminum alloy conductor (AAAC)
en_US
dc.subject
Adapted Computed Tomography (ACT)
en_US
dc.subject
Overhead lines
en_US
dc.subject
Wedge tension clamp
en_US
dc.title
Wire displacement of AAAC overhead line conductors at wedge tension clamp
en_US
dc.type
Journal Article
dc.rights.license
In Copyright - Non-Commercial Use Permitted
ethz.journal.title
CIGRE Science & Engineering
ethz.journal.volume
14
en_US
ethz.pages.start
49
en_US
ethz.pages.end
63
en_US
ethz.size
15 p.
en_US
ethz.version.deposit
publishedVersion
en_US
ethz.publication.place
Paris
en_US
ethz.publication.status
published
en_US
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::02632 - Inst. f. El. Energieübertragung u. Hoch. / Power Systems and High Voltage Lab.::03869 - Franck, Christian / Franck, Christian
en_US
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02130 - Dep. Maschinenbau und Verfahrenstechnik / Dep. of Mechanical and Process Eng.::02618 - Institut für Mechanische Systeme / Institute of Mechanical Systems::03605 - Mazza, Edoardo / Mazza, Edoardo
en_US
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02130 - Dep. Maschinenbau und Verfahrenstechnik / Dep. of Mechanical and Process Eng.::02618 - Institut für Mechanische Systeme / Institute of Mechanical Systems::03605 - Mazza, Edoardo / Mazza, Edoardo
en_US
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::02632 - Inst. f. El. Energieübertragung u. Hoch. / Power Systems and High Voltage Lab.::03869 - Franck, Christian / Franck, Christian
en_US
ethz.date.deposited
2019-06-26T17:58:57Z
ethz.source
FORM
ethz.eth
yes
en_US
ethz.availability
Open access
en_US
ethz.rosetta.installDate
2019-06-27T05:57:53Z
ethz.rosetta.lastUpdated
2021-02-15T04:55:38Z
ethz.rosetta.versionExported
true
ethz.COinS
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