Estimating the transfer function of the cantilever in atomic force microscopy
A system identification approach
Metadata only
Date
2005-12Type
- Journal Article
Publication status
publishedJournal / series
Journal of Applied PhysicsVolume
Pages / Article No.
Publisher
American Institute of PhysicsSubject
Transfer functions; Atomic force microscopy; Force sensorsOrganisational unit
03444 - Stemmer, Andreas / Stemmer, Andreas
Notes
Received 17 May 2005, Accepted 18 October 2005, Published online 7 December 2005.More
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