Estimating the transfer function of the cantilever in atomic force microscopy
A system identification approach
Metadata only
Datum
2005-12Typ
- Journal Article
ETH Bibliographie
yes
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Publikationsstatus
publishedExterne Links
Zeitschrift / Serie
Journal of Applied PhysicsBand
Seiten / Artikelnummer
Verlag
American Institute of PhysicsThema
Transfer functions; Atomic force microscopy; Force sensorsOrganisationseinheit
03444 - Stemmer, Andreas (emeritus) / Stemmer, Andreas (emeritus)
Anmerkungen
Received 17 May 2005, Accepted 18 October 2005, Published online 7 December 2005.ETH Bibliographie
yes
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