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dc.contributor.author
Stark, Martin
dc.contributor.author
Guckenberger, Reinhard
dc.contributor.author
Stemmer, Andreas
dc.contributor.author
Stark, Robert W.
dc.date.accessioned
2017-06-09T11:09:56Z
dc.date.available
2017-06-09T11:09:56Z
dc.date.issued
2005-12
dc.identifier.issn
0021-8979
dc.identifier.issn
1089-7550
dc.identifier.other
10.1063/1.2137887
dc.identifier.uri
http://hdl.handle.net/20.500.11850/35223
dc.language.iso
en
dc.publisher
American Institute of Physics
dc.subject
Transfer functions
dc.subject
Atomic force microscopy
dc.subject
Force sensors
dc.title
Estimating the transfer function of the cantilever in atomic force microscopy
dc.type
Journal Article
ethz.title.subtitle
A system identification approach
ethz.journal.title
Journal of Applied Physics
ethz.journal.volume
98
ethz.journal.issue
11
ethz.journal.abbreviated
J. Appl. Physi.
ethz.pages.start
114904
ethz.size
7 p.
ethz.notes
Received 17 May 2005, Accepted 18 October 2005, Published online 7 December 2005.
ethz.identifier.wos
ethz.identifier.nebis
000037502
ethz.publication.place
Melville, NY
ethz.publication.status
published
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02130 - Dep. Maschinenbau und Verfahrenstechnik / Dep. of Mechanical and Process Eng.::03444 - Stemmer, Andreas (emeritus) / Stemmer, Andreas (emeritus)
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02130 - Dep. Maschinenbau und Verfahrenstechnik / Dep. of Mechanical and Process Eng.::03444 - Stemmer, Andreas (emeritus) / Stemmer, Andreas (emeritus)
ethz.date.deposited
2017-06-09T11:10:29Z
ethz.source
ECIT
ethz.identifier.importid
imp59364e0d1f9b437462
ethz.ecitpid
pub:56456
ethz.eth
yes
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-07-18T15:30:12Z
ethz.rosetta.lastUpdated
2021-02-14T07:34:03Z
ethz.rosetta.exportRequired
true
ethz.rosetta.versionExported
true
ethz.COinS
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