Two-dimensional defect mapping of the SiO2/4H-SiC interface - Research Collection

Download

Full text (published version) (PDF, 2.474Mb)

Open access

Author

Johnson, Brett C.

Bongiorno, Corrado

Dutta, Dipanwita

Jung, Thomas A.

Grossner, Ulrike

Camarda, Massimo

Date

2019-08

Type

Journal Article

Citations

Cited 14 times in Web of Science

Cited 15 times in Scopus

ETH Bibliography

yes

Altmetrics

Download

Full text (published version) (PDF, 2.474Mb)

Rights / license

In Copyright - Non-Commercial Use Permitted

Permanent link

https://doi.org/10.3929/ethz-b-000358967

Publication status

published

External links

https://doi.org/10.1103/physrevmaterials.3.084602

Journal / series

Physical Review Materials

Volume

3(8)

Pages / Article No.

084602

Publisher

American Physical Society

Organisational unit

09480 - Grossner, Ulrike / Grossner, Ulrike

More

Show all metadata

Citations

Cited 14 times in Web of Science

Cited 15 times in Scopus

ETH Bibliography

yes

Altmetrics