New technique for the measurement of the static and of the transient junction temperature in IGBT devices under operating conditions
Metadata only
Date
2006Type
- Conference Paper
Publication status
publishedExternal links
Journal / series
Microelectronics ReliabilityVolume
Pages / Article No.
Publisher
ElsevierEvent
Organisational unit
03228 - Fichtner, Wolfgang
Notes
Available online 23 August 2006.More
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