Show simple item record

dc.contributor.author
Enning, Raoul
dc.contributor.author
Ziegler, Dominik
dc.contributor.author
Nievergelt, Adrian
dc.contributor.author
Friedlos, Ralph
dc.contributor.author
Venkataramani, Krithika
dc.contributor.author
Stemmer, Andreas
dc.date.accessioned
2017-06-09T11:31:31Z
dc.date.available
2017-06-09T11:31:31Z
dc.date.issued
2011-04
dc.identifier.issn
0034-6748
dc.identifier.issn
1089-7623
dc.identifier.other
10.1063/1.3575322
dc.identifier.uri
http://hdl.handle.net/20.500.11850/36217
dc.language.iso
en
dc.publisher
American Institute of Physics
dc.subject
atomic force microscopy
dc.subject
mica
dc.subject
optical images
dc.subject
optical sensors
dc.subject
photoconductivity
dc.subject
photodiodes
dc.subject
readout electronics
dc.title
A high frequency sensor for optical beam deflection atomic force microscopy
dc.type
Journal Article
ethz.journal.title
Review of Scientific Instruments
ethz.journal.volume
82
ethz.journal.issue
4
ethz.journal.abbreviated
Rev Sci Instrum
ethz.pages.start
043705
ethz.size
6 p.
ethz.notes
Received 10 December 2010, Accepted 18 March 2011, Published online 13 April 2011.
ethz.identifier.wos
ethz.identifier.nebis
000025185
ethz.publication.place
New York, NY
ethz.publication.status
published
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02130 - Dep. Maschinenbau und Verfahrenstechnik / Dep. of Mechanical and Process Eng.::03444 - Stemmer, Andreas / Stemmer, Andreas
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02130 - Dep. Maschinenbau und Verfahrenstechnik / Dep. of Mechanical and Process Eng.::03444 - Stemmer, Andreas / Stemmer, Andreas
ethz.date.deposited
2017-06-09T11:31:47Z
ethz.source
ECIT
ethz.identifier.importid
imp59364e224f38264677
ethz.ecitpid
pub:57924
ethz.eth
yes
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-07-18T09:47:45Z
ethz.rosetta.lastUpdated
2024-02-01T17:31:52Z
ethz.rosetta.versionExported
true
ethz.COinS
ctx_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.atitle=A%20high%20frequency%20sensor%20for%20optical%20beam%20deflection%20atomic%20force%20microscopy&rft.jtitle=Review%20of%20Scientific%20Instruments&rft.date=2011-04&rft.volume=82&rft.issue=4&rft.spage=043705&rft.issn=0034-6748&1089-7623&rft.au=Enning,%20Raoul&Ziegler,%20Dominik&Nievergelt,%20Adrian&Friedlos,%20Ralph&Venkataramani,%20Krithika&rft.genre=article&rft_id=info:doi/10.1063/1.3575322&
 Search print copy at ETH Library

Files in this item

FilesSizeFormatOpen in viewer

There are no files associated with this item.

Publication type

Show simple item record