Laser ablation inductively coupled plasma mass spectrometry for direct analysis of the spatial distribution of trace elements in metallurgical-grade silicon
- Journal Article
Journal / seriesAnalytical and Bioanalytical Chemistry
Pages / Article No.
SubjectMetallurgical-grade silicon; Elemental segregation; Quantification; LA-ICP-MS
Organisational unit03512 - Günther, Detlef
NotesReceived 4 May 2006, Revised 21 June 2006, Accepted 27 June 2006, Published online 12 August 2006.
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