Time-Resolved Short Circuit Failure Analysis of SiC MOSFETs

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Author
Ziemann, Thomascc
Tsibizov, Alexander
Kakarla, Bhagyalakshmi
Bort, Lorenzcc
Grossner, Ulrikecc
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Date
2019-05
Type
    Conference Paper
Rights / license
In Copyright - Non-Commercial Use Permitted
Permanent link
https://doi.org/10.3929/ethz-b-000366450
Publication status
published
External links
Book title
2019 31st International Symposium on Power Semiconductor Devices and ICs (ISPSD)
Pages / Article No.
219 - 222
Publisher
IEEE
Event
31st IEEE International Symposium on Power Semiconductor Devices and ICs (ISPSD), Shanghai, China, May 19-23, 2019
Organisational unit
09480 - Grossner, Ulrike / Grossner, Ulrike  
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Citations
Cited 6 times in Web of Science
Cited 7 times in Scopus
ETH Bibliography
yes
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