A TCAD-based yield and reliability analysis for VCSELs

Metadata only

Author

Date

2006

Type

Conference Paper

ETH Bibliography

yes

Altmetrics

Publication status

published

External links

Editor

Book title

Vertical-cavity surface-emitting lasers X : 25-26 January 2006, San Jose, California, USA

Journal / series

Proceedings of SPIE

Volume

6132

Pages / Article No.

613206

Publisher

SPIE

Event

Conference on Vertical-Cavity Surface-Emitting Lasers X, San Jose, CA, USA, January 25-26, 2006

Subject

VCSEL; Technology computer aided design (TCAD); Design for manufacturing (DFM); Yield analysis

Organisational unit

03675 - Witzigmann, Bernd

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ETH Bibliography

yes

Altmetrics

Research Collection