A TCAD-based yield and reliability analysis for VCSELs
dc.contributor.author
Odermatt, Stefan
dc.contributor.author
Eitel, Sven
dc.contributor.author
Hoevel, Rainer
dc.contributor.author
Letay, Gergoe
dc.contributor.author
Witzigmann, Bernd
dc.contributor.editor
Lei, Chun
dc.contributor.editor
Choquette, Kent D.
dc.date.accessioned
2017-06-09T11:49:29Z
dc.date.available
2017-06-09T11:49:29Z
dc.date.issued
2006
dc.identifier.isbn
0-8194-6174-1
dc.identifier.issn
0277-786X
dc.identifier.other
10.1117/12.641412
dc.identifier.uri
http://hdl.handle.net/20.500.11850/37037
dc.language.iso
en
dc.publisher
SPIE
dc.subject
VCSEL
dc.subject
Technology computer aided design (TCAD)
dc.subject
Design for manufacturing (DFM)
dc.subject
Yield analysis
dc.title
A TCAD-based yield and reliability analysis for VCSELs
dc.type
Conference Paper
ethz.book.title
Vertical-cavity surface-emitting lasers X : 25-26 January 2006, San Jose, California, USA
ethz.journal.title
Proceedings of SPIE
ethz.journal.volume
6132
ethz.journal.abbreviated
Proc. SPIE Int. Soc. Opt. Eng.
ethz.pages.start
613206
ethz.size
11 p.
ethz.event
Conference on Vertical-Cavity Surface-Emitting Lasers X
ethz.event.location
San Jose, CA, USA
ethz.event.date
January 25-26, 2006
ethz.identifier.wos
ethz.publication.place
Bellingham, WA
ethz.publication.status
published
ethz.leitzahl
03675 - Witzigmann, Bernd
ethz.leitzahl.certified
03675 - Witzigmann, Bernd
ethz.date.deposited
2017-06-09T11:49:57Z
ethz.source
ECIT
ethz.identifier.importid
imp59364e322cfa881191
ethz.ecitpid
pub:59165
ethz.eth
yes
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-07-26T05:10:33Z
ethz.rosetta.lastUpdated
2024-02-01T17:38:57Z
ethz.rosetta.versionExported
true
ethz.COinS
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Conference Paper [36293]