Design and Experimental Characterization of a New Built-In Defect-Based Testing Technique to Achieve Zero Defects in the Automotive Environment
- Journal Article
Journal / seriesIEEE Transactions on Device and Materials Reliability
SubjectBuilt-in self-test; Crystal defects; Gate oxide reliability; Gate stress test (GST)
NotesReceived 18 November 2010, Revised 14 March 2011,, Accepted 22 March 2011, Published 5 April 2011, Current version online 15 June 2011.
MoreShow all metadata