Scanning Probe Thermometry to study Thermoelectricity and Dissipation at Nanoscale Junctions
dc.contributor.author
Könemann, Fabian
dc.contributor.supervisor
Schenk, Andreas
dc.contributor.supervisor
Luisier, Mathieu
dc.contributor.supervisor
Brugger, Jürgen
dc.date.accessioned
2020-04-14T12:22:22Z
dc.date.available
2020-01-04T18:03:34Z
dc.date.available
2020-01-06T08:10:18Z
dc.date.available
2020-04-14T12:22:22Z
dc.date.issued
2019-08-21
dc.identifier.uri
http://hdl.handle.net/20.500.11850/387500
dc.identifier.doi
10.3929/ethz-b-000387500
dc.format
application/pdf
en_US
dc.language.iso
en
en_US
dc.publisher
ETH Zurich
en_US
dc.rights.uri
http://rightsstatements.org/page/InC-NC/1.0/
dc.title
Scanning Probe Thermometry to study Thermoelectricity and Dissipation at Nanoscale Junctions
en_US
dc.type
Doctoral Thesis
dc.rights.license
In Copyright - Non-Commercial Use Permitted
dc.date.published
2020-01-06
ethz.size
204 p.
en_US
ethz.code.ddc
DDC - DDC::5 - Science::530 - Physics
en_US
ethz.identifier.diss
26240
en_US
ethz.publication.place
Zurich
en_US
ethz.publication.status
published
en_US
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::02636 - Institut für Integrierte Systeme / Integrated Systems Laboratory::03925 - Luisier, Mathieu / Luisier, Mathieu::08837 - Schenk, Andreas (Tit.-Prof.)
en_US
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::02636 - Institut für Integrierte Systeme / Integrated Systems Laboratory::03925 - Luisier, Mathieu / Luisier, Mathieu
en_US
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::02636 - Institut für Integrierte Systeme / Integrated Systems Laboratory::03925 - Luisier, Mathieu / Luisier, Mathieu::08837 - Schenk, Andreas (Tit.-Prof.)
en_US
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::02636 - Institut für Integrierte Systeme / Integrated Systems Laboratory::03925 - Luisier, Mathieu / Luisier, Mathieu
ethz.date.deposited
2020-01-04T18:03:43Z
ethz.source
FORM
ethz.eth
yes
en_US
ethz.availability
Open access
en_US
ethz.rosetta.installDate
2020-01-06T08:10:30Z
ethz.rosetta.lastUpdated
2021-02-15T10:11:24Z
ethz.rosetta.versionExported
true
ethz.COinS
ctx_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.atitle=Scanning%20Probe%20Thermometry%20to%20study%20Thermoelectricity%20and%20Dissipation%20at%20Nanoscale%20Junctions&rft.date=2019-08-21&rft.au=K%C3%B6nemann,%20Fabian&rft.genre=unknown&rft.btitle=Scanning%20Probe%20Thermometry%20to%20study%20Thermoelectricity%20and%20Dissipation%20at%20Nanoscale%20Junctions
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Doctoral Thesis [30089]