Dynamic on-Resistance in GaN-on-Si HEMTs: Origins, Dependencies, and Future Characterization Frameworks - Research Collection

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Author

Zulauf, Grayson

Kolar, Johann W.

Date

2020-06

Type

Journal Article

Citations

Cited 28 times in Web of Science

Cited 33 times in Scopus

ETH Bibliography

yes

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Publication status

published

External links

https://doi.org/10.1109/TPEL.2019.2955656

Journal / series

IEEE Transactions on Power Electronics

Volume

35(6)

Pages / Article No.

5581 - 5588

Publisher

Institute of Electrical and Electronic Engineers

Organisational unit

02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.
03573 - Kolar, Johann W. / Kolar, Johann W.

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Show all metadata

Citations

Cited 28 times in Web of Science

Cited 33 times in Scopus

ETH Bibliography

yes

Altmetrics