Electronic Polarizability as the Fundamental Variable in the Dielectric Properties of Two-Dimensional Materials

Tian, Tian; Scullion, Declan; Hughes, Dale; Li, Lu H.; Shih, Chih-Jen; Coleman, Jonathan; Chhowalla, Manish; Santos, Elton J.G.

doi:10.1021/acs.nanolett.9b02982

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Author

Date

2020-02-12

Type

Journal Article

Citations

Cited 33 times in Web of Science

Cited 32 times in Scopus

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yes

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Publication status

published

External links

https://doi.org/10.1021/acs.nanolett.9b02982

Journal / series

Nano Letters

Volume

20(2)

Pages / Article No.

841 - 851

Publisher

American Chemical Society

Subject

Dielectric screening; electronic polarizability; two-dimensionalmaterial; scaling relation; first priciples simulations; dielectric anisotropy

Organisational unit

09502 - Shih, Chih-Jen / Shih, Chih-Jen

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Citations

Cited 33 times in Web of Science

Cited 32 times in Scopus

ETH Bibliography

yes

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