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dc.contributor.author
Theocharides, Theocharis
dc.contributor.author
Shafique, Muhammad
dc.contributor.author
Choi, Jungwook
dc.contributor.author
Mutlu, Onur
dc.date.accessioned
2020-05-06T08:40:24Z
dc.date.available
2020-05-06T02:48:44Z
dc.date.available
2020-05-06T08:40:24Z
dc.date.issued
2020-04
dc.identifier.issn
2168-2364
dc.identifier.issn
2168-2356
dc.identifier.other
10.1109/MDAT.2020.2971201
en_US
dc.identifier.uri
http://hdl.handle.net/20.500.11850/413239
dc.language.iso
en
en_US
dc.publisher
IEEE
en_US
dc.title
Guest Editorial: Robust Resource-Constrained Systems for Machine Learning
en_US
dc.type
Other Journal Item
dc.date.published
2020-04-21
ethz.journal.title
IEEE Design & Test
ethz.journal.volume
37
en_US
ethz.journal.issue
2
en_US
ethz.pages.start
5
en_US
ethz.pages.end
7
en_US
ethz.identifier.wos
ethz.identifier.scopus
ethz.publication.place
New York, NY
en_US
ethz.publication.status
published
en_US
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::09483 - Mutlu, Onur / Mutlu, Onur
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::09483 - Mutlu, Onur / Mutlu, Onur
ethz.date.deposited
2020-05-06T02:48:52Z
ethz.source
SCOPUS
ethz.eth
yes
en_US
ethz.availability
Metadata only
en_US
ethz.rosetta.installDate
2020-05-06T08:40:34Z
ethz.rosetta.lastUpdated
2022-03-29T02:03:19Z
ethz.rosetta.versionExported
true
ethz.COinS
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