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dc.contributor.author
Ruhm, Karl H.
dc.contributor.editor
Scharff, Peter
dc.contributor.editor
Linss, Gerhard
dc.date.accessioned
2017-06-09T17:18:20Z
dc.date.available
2017-06-09T17:18:20Z
dc.date.issued
2011
dc.identifier.uri
http://hdl.handle.net/20.500.11850/41438
dc.language.iso
en
dc.publisher
Univ.-Bibliothek, ilmedia
dc.subject
Metrology
dc.subject
Mathematical model
dc.subject
Signal and system theory
dc.subject
Top-down strategy
dc.title
From Verbal Models to Mathematical Models: A Didactical Concept not just in Metrology
dc.type
Conference Paper
ethz.book.title
Proceedings of the 14th Joint International IMEKO TC1 + TC7 + TC 13 Symposium : "Intelligent quality measurements - theory, education and training" ; in conjunction with the 56th IWK, Ilmenau University of Technology and the 11th SpectroNet Collaboration
ethz.size
10 p.
ethz.event
Joint International IMEKO TC1+TC7+TC13 Symposium 2011
ethz.event.location
Jena, Germany
ethz.event.date
August 31 - September 2, 2011
ethz.notes
.
ethz.publication.place
Ilmenau
ethz.publication.status
published
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02130 - Dep. Maschinenbau und Verfahrenstechnik / Dep. of Mechanical and Process Eng.::02623 - Inst. f. Werkzeugmaschinen und Fertigung / Inst. Machine Tools and Manufacturing::03641 - Wegener, Konrad / Wegener, Konrad
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02130 - Dep. Maschinenbau und Verfahrenstechnik / Dep. of Mechanical and Process Eng.::02623 - Inst. f. Werkzeugmaschinen und Fertigung / Inst. Machine Tools and Manufacturing::03641 - Wegener, Konrad / Wegener, Konrad
ethz.date.deposited
2017-06-09T17:18:40Z
ethz.source
ECIT
ethz.identifier.importid
imp59364ea7991fe47882
ethz.ecitpid
pub:69336
ethz.eth
yes
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-07-15T06:12:09Z
ethz.rosetta.lastUpdated
2018-10-01T14:24:06Z
ethz.rosetta.versionExported
true
ethz.COinS
ctx_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.atitle=From%20Verbal%20Models%20to%20Mathematical%20Models:%20A%20Didactical%20Concept%20not%20just%20in%20Metrology&rft.date=2011&rft.au=Ruhm,%20Karl%20H.&rft.genre=proceeding&rft.btitle=Proceedings%20of%20the%2014th%20Joint%20International%20IMEKO%20TC1%20+%20TC7%20+%20TC%2013%20Symposium%20:%20%22Intelligent%20quality%20measurements%20-%20theory,%20edu
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