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dc.contributor.author
Tacke, Sebastian
dc.contributor.author
Krzyzanek, Vladislav
dc.contributor.author
Nüsse, Harald
dc.contributor.author
Rosenthal, Alexander
dc.contributor.author
Klingauf, Jürgen
dc.contributor.author
Wepf, Roger A.
dc.contributor.author
Reichelt, Rudolf
dc.date.accessioned
2020-06-23T08:01:36Z
dc.date.available
2020-05-27T12:09:10Z
dc.date.available
2020-06-23T08:01:36Z
dc.date.issued
2016
dc.identifier.isbn
978-3-527-34297-6
en_US
dc.identifier.isbn
978-3-527-80846-5
en_US
dc.identifier.other
10.1002/9783527808465.emc2016.6577
en_US
dc.identifier.uri
http://hdl.handle.net/20.500.11850/416904
dc.language.iso
en
en_US
dc.publisher
Wiley
en_US
dc.subject
high‐vacuum cryo transfer
en_US
dc.subject
cryo‐EM
en_US
dc.title
A versatile high-vacuum cryo transfer system for cryo microscopy and analytics
en_US
dc.type
Conference Paper
dc.date.published
2016-12-20
ethz.book.title
European Microscopy Congress 2016: Proceedings
en_US
ethz.pages.start
412
en_US
ethz.pages.end
413
en_US
ethz.event
European Microscopy Congress 2016
en_US
ethz.event.location
Lyon, France
en_US
ethz.event.date
August 28 - September 2, 2016
en_US
ethz.publication.place
Lyon
en_US
ethz.publication.status
published
en_US
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00003 - Schulleitung und Dienste::00022 - Bereich VP Forschung / Domain VP Research::02891 - ScopeM / ScopeM::06226 - ScopeM - Cryo Electron Microscopy Unit / ScopeM - Cryo Electron Microscopy Unit
en_US
ethz.date.deposited
2020-05-27T12:09:10Z
ethz.source
FORM
ethz.eth
yes
en_US
ethz.availability
Metadata only
en_US
ethz.rosetta.installDate
2020-06-23T08:01:48Z
ethz.rosetta.lastUpdated
2020-06-23T08:01:48Z
ethz.rosetta.versionExported
true
ethz.COinS
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