Current and Temperature Measurement Concepts Enabling Intelligent Gate Drives
dc.contributor.author
lobsiger, Yannick
dc.contributor.author
Kolar, Johann W.
dc.date.accessioned
2017-06-09T17:40:42Z
dc.date.available
2017-06-09T17:40:42Z
dc.date.issued
2011
dc.identifier.uri
http://hdl.handle.net/20.500.11850/42102
dc.language.iso
en
dc.publisher
European Center for Power Electronics (ECPE)
dc.title
Current and Temperature Measurement Concepts Enabling Intelligent Gate Drives
dc.type
Other Conference Item
ethz.size
20 slides
ethz.event
ECPE Workshop ”Electronics around the Power Switch: Gate Drivers, Sensors and Control”
ethz.event.location
Munich, Germany
ethz.event.date
June 29-30, 2011
ethz.notes
Conference lecture on 30 June 2011.
ethz.publication.status
published
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::03573 - Kolar, Johann W. / Kolar, Johann W.
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::03573 - Kolar, Johann W. / Kolar, Johann W.
ethz.date.deposited
2017-06-09T17:41:04Z
ethz.source
ECIT
ethz.identifier.importid
imp59364eb4598e386519
ethz.ecitpid
pub:70239
ethz.eth
yes
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-07-14T18:40:17Z
ethz.rosetta.lastUpdated
2023-02-06T11:03:09Z
ethz.rosetta.versionExported
true
ethz.COinS
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Other Conference Item [17985]