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dc.contributor.author
Gungor, Arif
dc.contributor.author
Smajic, Jasmin
dc.contributor.author
Moro, Federico
dc.contributor.author
Leuthold, Juerg
dc.date.accessioned
2020-08-05T08:09:20Z
dc.date.available
2020-08-05T08:09:20Z
dc.date.issued
2019
dc.identifier.isbn
978-1-7281-3403-1
en_US
dc.identifier.isbn
978-1-7281-3404-8
en_US
dc.identifier.other
10.1109/PIERS-Spring46901.2019.9017879
en_US
dc.identifier.uri
http://hdl.handle.net/20.500.11850/430064
dc.description.abstract
This paper presents a transient electromagnetic Maxwell solver (MS), a transient semiconductor Poisson-Drift-Diffusion (PDD) solver, and their numerical coupling. The proposed numerical solution schemes are based on Finite Element Method (FEM). Due to the solvers complexity it is important to carefully examine the obtained initial results. Therefore, a simple 1D pnjunction diode illuminated by an external electromagnetic plane wave is considered, as the stationary solutions of this structure such as the depletion width, built-in voltage, and carrier concentration distribution can be analytically obtained. The presented initially obtained transient results converge well to the analytic stationary solutions. The electromagnetic waves reflected from a diode with zero bias and 0.8V bias structure reveal a small signal difference within a wide frequency range, which is an encouraging initial step towards more realistic simulations of scanning microwave microscopy structures and arrangements. The extension of the presented field formulations and numerical methods to 2D and 3D problems is straightforward.
en_US
dc.language.iso
en
en_US
dc.publisher
IEEE
en_US
dc.title
Time-domain Coupled Full Maxwell- and Drift-diffusion-solver for Simulating Scanning Microwave Microscopy of Semiconductors
en_US
dc.type
Conference Paper
dc.date.published
2020-03-02
ethz.book.title
2019 Photonics & Electromagnetics Research Symposium - Spring (PIERS-Spring)
en_US
ethz.pages.start
4071
en_US
ethz.pages.end
4077
en_US
ethz.event
2019 PhotonIcs and Electromagnetics Research Symposium - Spring (PIERS-Spring 2019)
en_US
ethz.event.location
Rome, Italy
en_US
ethz.event.date
June 17-20, 2019
en_US
ethz.grant
Microwave Microscopy for Advanced and Efficient Materials Analysis and Production
en_US
ethz.identifier.wos
ethz.identifier.scopus
ethz.publication.place
Piscataway, NJ
en_US
ethz.publication.status
published
en_US
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::02635 - Institut für Elektromagnetische Felder / Electromagnetic Fields Laboratory::03974 - Leuthold, Juerg / Leuthold, Juerg
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::02635 - Institut für Elektromagnetische Felder / Electromagnetic Fields Laboratory
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::02635 - Institut für Elektromagnetische Felder / Electromagnetic Fields Laboratory::03974 - Leuthold, Juerg / Leuthold, Juerg
ethz.grant.agreementno
761036
ethz.grant.fundername
EC
ethz.grant.funderDoi
10.13039/501100000780
ethz.grant.program
H2020
ethz.date.deposited
2020-03-28T10:36:14Z
ethz.source
WOS
ethz.source
SCOPUS
ethz.eth
yes
en_US
ethz.availability
Metadata only
en_US
ethz.rosetta.installDate
2020-08-05T08:09:42Z
ethz.rosetta.lastUpdated
2022-03-29T02:45:32Z
ethz.rosetta.versionExported
true
dc.identifier.olduri
http://hdl.handle.net/20.500.11850/429972
dc.identifier.olduri
http://hdl.handle.net/20.500.11850/407052
ethz.COinS
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