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dc.contributor.author
Marone, F.
dc.contributor.author
Mokso, R.
dc.contributor.author
Modregger, P.
dc.contributor.author
Fife, J.
dc.contributor.author
Pinzer, B.
dc.contributor.author
Thuring, T.
dc.contributor.author
Mader, K.
dc.contributor.author
Mikuljan, G.
dc.contributor.author
Isenegger, A.
dc.contributor.author
Stampanoni, M.
dc.date.accessioned
2017-06-09T18:12:36Z
dc.date.available
2017-06-09T18:12:36Z
dc.date.issued
2011
dc.identifier.other
10.1063/1.3625318
dc.identifier.uri
http://hdl.handle.net/20.500.11850/43466
dc.language.iso
en
dc.publisher
American Institute of Physics
dc.title
Present and Future X-ray Tomographic Microscopy at TOMCAT
dc.type
Journal Article
ethz.journal.title
AIP Conference Proceedings
ethz.journal.volume
1365
ethz.pages.start
116
ethz.pages.end
119
ethz.event
The 10th International Conference on X-ray Microscopy
ethz.event.location
Chicago, Illinois USA
ethz.event.date
August 15‐20, 2010
ethz.identifier.nebis
000025027
ethz.publication.place
Melville, N.Y.
ethz.publication.status
published
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::02631 - Institut für Biomedizinische Technik / Institute for Biomedical Engineering::03817 - Stampanoni, Marco F.M. / Stampanoni, Marco F.M.
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::02631 - Institut für Biomedizinische Technik / Institute for Biomedical Engineering::03817 - Stampanoni, Marco F.M. / Stampanoni, Marco F.M.
ethz.date.deposited
2017-06-09T18:13:02Z
ethz.source
ECIT
ethz.identifier.importid
imp59364ecae787b32197
ethz.ecitpid
pub:72051
ethz.eth
yes
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-07-12T14:31:46Z
ethz.rosetta.lastUpdated
2020-02-14T09:18:13Z
ethz.rosetta.versionExported
true
ethz.COinS
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