Effective mass measurement: The influence of hole band nonparabolicity in SiGe/Ge quantum wells

Metadata only

Author

Date

2007

Type

Conference Paper

ETH Bibliography

yes

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Publication status

published

External links

Journal / series

Semiconductor Science and Technology

Volume

22(1)

Pages / Article No.

S191 - S194

Publisher

IOP Publishing

Event

3rd International SiGe Technology and Device Meeting (ISTDM 2006), Princeton, NJ, USA, May 15-17, 2006

Organisational unit

03569 - Batlogg, Bertram (emeritus)

Notes

Received 14 May 2006, in final form 27 September 2006, Published 7 December 2006.

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