Effective mass measurement

The influence of hole band nonparabolicity in SiGe/Ge quantum wells
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Autor(in)
Roessner, Benjamin
Kaenel, Hans von
Chrastina, Daniel
Isella, Giovanni
Batlogg, Bertram
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Datum
2007
Typ
    Conference Paper
Publikationsstatus
published
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Zeitschrift / Serie
Semiconductor Science and Technology
Band
22(1)
Seiten / Artikelnummer
S191 - S194
Verlag
IOP Publishing
Konferenz
3rd International SiGe Technology and Device Meeting (ISTDM 2006), Princeton, NJ, USA, May 15-17, 2006
Organisationseinheit
03569 - Batlogg, Bertram (emeritus)  
Anmerkungen
Received 14 May 2006, in final form 27 September 2006, Published 7 December 2006.
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