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dc.contributor.author
Roessner, Benjamin
dc.contributor.author
Kaenel, Hans von
dc.contributor.author
Chrastina, Daniel
dc.contributor.author
Isella, Giovanni
dc.contributor.author
Batlogg, Bertram
dc.date.accessioned
2017-06-08T16:36:22Z
dc.date.available
2017-06-08T16:36:22Z
dc.date.issued
2007
dc.identifier.issn
0268-1242
dc.identifier.issn
1361-6641
dc.identifier.other
10.1088/0268-1242/22/1/S45
dc.identifier.uri
http://hdl.handle.net/20.500.11850/4443
dc.language.iso
en
dc.publisher
IOP Publishing
dc.title
Effective mass measurement
dc.type
Conference Paper
ethz.title.subtitle
The influence of hole band nonparabolicity in SiGe/Ge quantum wells
ethz.journal.title
Semiconductor Science and Technology
ethz.journal.volume
22
ethz.journal.issue
1
ethz.journal.abbreviated
Semicond. sci. technol.
ethz.pages.start
S191
ethz.pages.end
S194
ethz.event
3rd International SiGe Technology and Device Meeting (ISTDM 2006)
ethz.event.location
Princeton, NJ, USA
ethz.event.date
May 15-17, 2006
ethz.notes
Received 14 May 2006, in final form 27 September 2006, Published 7 December 2006.
ethz.identifier.wos
ethz.identifier.nebis
000034381
ethz.publication.place
Bristol
ethz.publication.status
published
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich, direkt::00012 - Lehre und Forschung, direkt::00007 - Departemente, direkt::02010 - Departement Physik / Department of Physics::02505 - Laboratorium für Festkörperphysik (LFP) / Laboratory for Solid State Physics (LFP)::03569 - Batlogg, Bertram (emeritus)
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich, direkt::00012 - Lehre und Forschung, direkt::00007 - Departemente, direkt::02010 - Departement Physik / Department of Physics::02505 - Laboratorium für Festkörperphysik (LFP) / Laboratory for Solid State Physics (LFP)::03569 - Batlogg, Bertram (emeritus)
ethz.date.deposited
2017-06-08T16:36:42Z
ethz.source
ECIT
ethz.identifier.importid
imp59364b79da34949334
ethz.ecitpid
pub:14579
ethz.eth
yes
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-07-14T12:48:38Z
ethz.rosetta.lastUpdated
2024-02-01T14:16:32Z
ethz.rosetta.versionExported
true
ethz.COinS
ctx_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.atitle=Effective%20mass%20measurement&rft.jtitle=Semiconductor%20Science%20and%20Technology&rft.date=2007&rft.volume=22&rft.issue=1&rft.spage=S191&rft.epage=S194&rft.issn=0268-1242&1361-6641&rft.au=Roessner,%20Benjamin&Kaenel,%20Hans%20von&Chrastina,%20Daniel&Isella,%20Giovanni&Batlogg,%20Bertram&rft.genre=proceeding&rft_id=info:doi/10.1088/0268-1242/22/1/S45&
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