Probabilistic certification of pan-tilt-zoom camera surveillance systems
dc.contributor.author
Raimondo, Davide M.
dc.contributor.author
Kariotoglou, Nikolaos
dc.contributor.author
Summers, Sean
dc.contributor.author
Lygeros, John
dc.date.accessioned
2017-06-09T18:34:27Z
dc.date.available
2017-06-09T18:34:27Z
dc.date.issued
2011
dc.identifier.isbn
978-1-612-84799-3
dc.identifier.isbn
978-1-612-84800-6
dc.identifier.other
10.1109/CDC.2011.6161534
dc.identifier.uri
http://hdl.handle.net/20.500.11850/44545
dc.language.iso
en
dc.publisher
IEEE
dc.title
Probabilistic certification of pan-tilt-zoom camera surveillance systems
dc.type
Conference Paper
ethz.book.title
2011 50th IEEE Conference on Decision and Control and European Control Conference : (CDC-ECC) ; 12 - 15 Dec. 2011, Orlando, FL, USA
ethz.pages.start
2064
ethz.pages.end
2069
ethz.event
50th IEEE Conference on Decision and Control and European Control Conference (CDC-ECC)
ethz.event.location
Orlando, FL, USA
ethz.event.date
December 12-15, 2011
ethz.publication.place
Piscataway, NJ
ethz.publication.status
published
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::02650 - Institut für Automatik / Automatic Control Laboratory::03751 - Lygeros, John / Lygeros, John
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::02650 - Institut für Automatik / Automatic Control Laboratory::03751 - Lygeros, John / Lygeros, John
ethz.date.deposited
2017-06-09T18:34:54Z
ethz.source
ECIT
ethz.identifier.importid
imp59364edc8dc8754978
ethz.ecitpid
pub:73469
ethz.eth
yes
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-07-12T17:47:53Z
ethz.rosetta.lastUpdated
2021-02-14T08:24:26Z
ethz.rosetta.versionExported
true
ethz.COinS
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