Non-topographic contrast in constant-current Scanning Field-Emission Microscopy (SFEM)

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Author
Westholm, Daniel
Wei, Jiapeng
Bertolini, Gabrielecc
Gürlü, Oguzhancc
Pescia, Danilocc
Ramsperger, Urs
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Date
2020
Type
    Conference Paper
Abstract
Scanning Tunneling Microscopy is performed in the conventional (tunneling) and in the field-emission regime. Images of W(110)-surfaces with and without some carbon content are taken in the constant current mode, in which the tip-target vertical distance displaces to compensate for the changes of th Show more
Publication status
published
External links
Book title
2020 33rd International Vacuum Nanoelectronics Conference (IVNC)
Pages / Article No.
9203360
Publisher
IEEE
Event
33rd International Vacuum Nanoelectronics Conference (IVNC 2020) (virtual), Lyon, France, July 6-10, 2020
Subject
Scanning Tunneling Microscope; Field Emission; Low Energy Electron microscopy; Contact potential
Organisational unit
03351 - Pescia, Danilo (emeritus) / Pescia, Danilo (emeritus)  
Funding
606988 - Sources, Interaction with Matter, Detection and Analysis of Low Energy Electrons 2 (EC)
134422 - Spin Polarized Secondary Electron Imaging (SNF)
Notes
Due to the Coronavirus (COVID-19) the conference was conducted virtually.
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Citations
Cited 1 times in Scopus
ETH Bibliography
yes
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