Interrelationship between grain size induced and strain induced broadening of X ray diffraction profiles
Rupp, J. L. M.
Gauckler, L. J.
- Journal Article
Journal / seriesScripta materialia
SubjectX-ray diffraction; Grain boundaries; Crystallization; Nanostructure; Ceramic thin films
Organisational unit03270 - Gauckler, Ludwig J.
NotesReceived 16 August 2011, Revised 23 October 2011, Accepted 24 October 2011, Published online 29 October 2011.
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