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dc.contributor.author
Studer, Christoph
dc.contributor.author
Baraniuk, Richard G.
dc.date.accessioned
2020-12-17T07:00:22Z
dc.date.available
2020-12-08T08:12:29Z
dc.date.available
2020-12-17T07:00:22Z
dc.date.issued
2012
dc.identifier.isbn
978-1-4673-0046-9
en_US
dc.identifier.isbn
978-1-4673-0045-2
en_US
dc.identifier.isbn
978-1-4673-0044-5
en_US
dc.identifier.other
10.1109/ICASSP.2012.6288631
en_US
dc.identifier.uri
http://hdl.handle.net/20.500.11850/455180.1
dc.identifier.uri
http://hdl.handle.net/20.500.11850/455180
dc.identifier.doi
10.3929/ethz-b-000455180
dc.description.abstract
In this paper, we investigate dictionary learning (DL) from sparsely corrupted or compressed signals. We consider three cases: I) the training signals are corrupted, and the locations of the corruptions are known, II) the locations of the sparse corruptions are unknown, and III) DL from compressed measurements, as it occurs in blind compressive sensing. We develop two efficient DL algorithms that are capable of learning dictionaries from sparsely corrupted or compressed measurements. Empirical phase transitions and an in-painting example demonstrate the capabilities of our algorithms.
en_US
dc.format
application/pdf
en_US
dc.language.iso
en
en_US
dc.publisher
IEEE
en_US
dc.rights.uri
http://rightsstatements.org/page/InC-NC/1.0/
dc.subject
Dictionary learning
en_US
dc.subject
Sparse approximation
en_US
dc.subject
Compressive sensing
en_US
dc.subject
Signal restoration
en_US
dc.subject
In-painting
en_US
dc.title
Dictionary learning from sparsely corrupted or compressed signals
en_US
dc.type
Conference Paper
dc.rights.license
In Copyright - Non-Commercial Use Permitted
dc.date.published
2012-08-31
ethz.book.title
2012 IEEE International Conference on Acoustics, Speech and Signal Processing (ICASSP)
en_US
ethz.pages.start
3341
en_US
ethz.pages.end
3344
en_US
ethz.size
4 p.
en_US
ethz.version.deposit
acceptedVersion
en_US
ethz.event
37th International Conference on Acoustics, Speech, and Signal Processing (ICASSP 2012)
en_US
ethz.event.location
Kyoto, Japan
en_US
ethz.event.date
March 25-30, 2012
en_US
ethz.publication.place
Piscataway, NJ
en_US
ethz.publication.status
published
en_US
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::02636 - Institut für Integrierte Systeme / Integrated Systems Laboratory::09695 - Studer, Christoph / Studer, Christoph
en_US
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::02636 - Institut für Integrierte Systeme / Integrated Systems Laboratory::09695 - Studer, Christoph / Studer, Christoph
en_US
ethz.date.deposited
2020-12-08T08:12:44Z
ethz.source
FORM
ethz.eth
no
en_US
ethz.availability
Open access
en_US
ethz.rosetta.installDate
2021-02-15T22:34:09Z
ethz.rosetta.lastUpdated
2021-02-15T22:34:09Z
ethz.rosetta.versionExported
true
ethz.rosetta.versionExported
true
ethz.COinS
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