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dc.contributor.author
Teppati, Valeria
dc.contributor.author
Bolognesi, Colombo R.
dc.date.accessioned
2017-06-09T19:41:37Z
dc.date.available
2017-06-09T19:41:37Z
dc.date.issued
2012-03
dc.identifier.issn
0018-9456
dc.identifier.issn
1557-9662
dc.identifier.other
10.1109/TIM.2011.2172119
dc.identifier.uri
http://hdl.handle.net/20.500.11850/46717
dc.language.iso
en
dc.publisher
IEEE
dc.subject
Calibration
dc.subject
Load-pull
dc.subject
Microwave measurements
dc.subject
Millimeter-wave transistors
dc.subject
Uncertainty
dc.title
Evaluation and Reduction of Calibration Residual Uncertainty in Load-Pull Measurements at Millimeter-Wave Frequencies
dc.type
Journal Article
ethz.journal.title
IEEE Transactions on Instrumentation and Measurement
ethz.journal.volume
61
ethz.journal.issue
3
ethz.journal.abbreviated
IEEE trans. instrum. meas
ethz.pages.start
817
ethz.pages.end
822
ethz.identifier.wos
ethz.identifier.nebis
000034985
ethz.publication.place
New York
ethz.publication.status
published
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::03721 - Bolognesi, Colombo / Bolognesi, Colombo
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::03721 - Bolognesi, Colombo / Bolognesi, Colombo
ethz.date.deposited
2017-06-09T19:42:51Z
ethz.source
ECIT
ethz.identifier.importid
imp59364f04c11e569128
ethz.ecitpid
pub:76801
ethz.eth
yes
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-07-18T11:12:38Z
ethz.rosetta.lastUpdated
2021-02-14T08:34:42Z
ethz.rosetta.versionExported
true
ethz.COinS
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