Application of dynamic phase shifting with wavelet analysis to electronic speckle contouring
dc.contributor.author
Goudemand, Nicolas
dc.date.accessioned
2017-06-09T19:53:16Z
dc.date.available
2017-06-09T19:53:16Z
dc.date.issued
2006
dc.identifier.issn
0003-6935
dc.identifier.issn
1559-128X
dc.identifier.issn
2155-3165
dc.identifier.other
10.1364/AO.45.003704
dc.identifier.uri
http://hdl.handle.net/20.500.11850/46994
dc.language.iso
en
dc.publisher
Optical Society of America
dc.title
Application of dynamic phase shifting with wavelet analysis to electronic speckle contouring
dc.type
Journal Article
ethz.journal.title
Applied Optics
ethz.journal.volume
45
ethz.journal.issue
16
ethz.journal.abbreviated
Appl. opt.
ethz.pages.start
3704
ethz.pages.end
3711
ethz.notes
Original Manuscript 11 August 2005, Revised Manuscript 7 October 2005, Manuscript Accepted 11 October 2005.
ethz.identifier.nebis
000038982
ethz.publication.place
Washington, DC
ethz.publication.status
published
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02130 - Dep. Maschinenbau und Verfahrenstechnik / Dep. of Mechanical and Process Eng.::02665 - Inst. f. Design, Mat. und Fabrikation::03507 - Ermanni, Paolo / Ermanni, Paolo
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02130 - Dep. Maschinenbau und Verfahrenstechnik / Dep. of Mechanical and Process Eng.::02665 - Inst. f. Design, Mat. und Fabrikation::03507 - Ermanni, Paolo / Ermanni, Paolo
ethz.date.deposited
2017-06-09T19:54:47Z
ethz.source
ECIT
ethz.identifier.importid
imp59364f0a5808c24807
ethz.ecitpid
pub:77222
ethz.eth
yes
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-07-13T07:14:57Z
ethz.rosetta.lastUpdated
2021-02-14T08:35:52Z
ethz.rosetta.versionExported
true
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