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dc.contributor.author
Park, Jong Hyuk
dc.contributor.author
Nagpal, Prashant
dc.contributor.author
Oh, Sang-Hyun
dc.contributor.author
Norris, David J.
dc.date.accessioned
2017-06-09T19:57:10Z
dc.date.available
2017-06-09T19:57:10Z
dc.date.issued
2012-02
dc.identifier.issn
0003-6951
dc.identifier.issn
1077-3118
dc.identifier.other
10.1063/1.3687910
dc.identifier.uri
http://hdl.handle.net/20.500.11850/47089
dc.language.iso
en
dc.publisher
American Institute of Physics
dc.title
Improved dielectric functions in metallic films obtained via template stripping
dc.type
Journal Article
ethz.journal.title
Applied Physics Letters
ethz.journal.volume
100
ethz.journal.issue
8
ethz.journal.abbreviated
Appl. phys. lett.
ethz.pages.start
081105
ethz.size
4 p.
ethz.notes
Received 7 November 2011, Accepted 2 February 2012, Published online 22 February 2012.
ethz.identifier.wos
ethz.identifier.nebis
000038985
ethz.publication.place
Melville, NY
ethz.publication.status
published
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02130 - Dep. Maschinenbau und Verfahrenstechnik / Dep. of Mechanical and Process Eng.::02668 - Inst. f. Energie- und Verfahrenstechnik / Inst. Energy and Process Engineering::03875 - Norris, David J. / Norris, David J.
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02130 - Dep. Maschinenbau und Verfahrenstechnik / Dep. of Mechanical and Process Eng.::02668 - Inst. f. Energie- und Verfahrenstechnik / Inst. Energy and Process Engineering::03875 - Norris, David J. / Norris, David J.
ethz.date.deposited
2017-06-09T19:58:58Z
ethz.source
ECIT
ethz.identifier.importid
imp59364f0c4626c41385
ethz.ecitpid
pub:77404
ethz.eth
yes
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-07-17T07:47:49Z
ethz.rosetta.lastUpdated
2021-02-14T08:36:21Z
ethz.rosetta.versionExported
true
ethz.COinS
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