Impact of Orientation Misalignments on Black Phosphorus Ultrascaled Field-Effect Transistors
Metadata only
Date
2021-03Type
- Journal Article
Abstract
Two-dimensional materials with strong bandstructure anisotropy such as black phosphorus (BP) have been identified as attractive candidates for logic application due to their potential high carrier velocity and large density-of-states. However, perfectly aligning the source-to-drain axis with the desired crystal orientation remains an experimental challenge. In this letter, we use an advanced quantum transport approach from first-principle to shed light on the influence of orientation misalignments on the performance of BP-based field-effect transistors. Both n -and p -type configurations are investigated for six alignment angles, in the ballistic limit of transport and in the presence of electron-phonon and charged impurity scattering. It is found that up to deviations of 50° from the optimal angle, the ON-state current only decreases by 30%. This behavior is explained by considering a single bandstructure parameter, the effective mass along transport direction. Show more
Publication status
publishedExternal links
Journal / series
IEEE Electron Device LettersVolume
Pages / Article No.
Publisher
IEEESubject
2D materials; black phosphorus; transistors; bandstructure anisotropy; device simulationOrganisational unit
03925 - Luisier, Mathieu / Luisier, Mathieu
Funding
175479 - Ab-initio modeling of electro-thermal effects in 2-D materials: from single-layer to van der Waals heterostructure (ABIME) (SNF)
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