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dc.contributor.author
Belius, David
dc.date.accessioned
2017-06-09T23:33:32Z
dc.date.available
2017-06-09T23:33:32Z
dc.date.issued
2012
dc.identifier.other
10.1214/11-AAP770
dc.identifier.uri
http://hdl.handle.net/20.500.11850/48445
dc.language.iso
en
dc.publisher
Institute of Mathematical Statistics
dc.subject
Cover level
dc.subject
Random interlacements
dc.subject
Cover time
dc.subject
Uncovered set
dc.subject
Gumbel distributional limit
dc.title
Cover levels and random interlacements
dc.type
Journal Article
ethz.journal.title
Annals of Applied Probability
ethz.journal.volume
22
ethz.journal.issue
2
ethz.pages.start
522
ethz.pages.end
540
ethz.notes
Received March 2010, Revised December 2010.
ethz.identifier.wos
ethz.identifier.nebis
000585235
ethz.publication.place
Cleveland, OH
ethz.publication.status
published
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02000 - Dep. Mathematik / Dep. of Mathematics::02003 - Mathematik Selbständige Professuren::03320 - Sznitman, Alain-Sol / Sznitman, Alain-Sol
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02000 - Dep. Mathematik / Dep. of Mathematics::02003 - Mathematik Selbständige Professuren::03320 - Sznitman, Alain-Sol / Sznitman, Alain-Sol
ethz.date.deposited
2017-06-09T23:34:48Z
ethz.source
ECIT
ethz.identifier.importid
imp59364f29a2a7660322
ethz.ecitpid
pub:79741
ethz.eth
yes
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-07-14T14:41:46Z
ethz.rosetta.lastUpdated
2018-10-01T16:42:44Z
ethz.rosetta.versionExported
true
ethz.COinS
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