Open access
Author
Date
2021-08-15Type
- Journal Article
Abstract
The electrical liquid film thickness (LFT) sensor developed at ETH Zurich is applied to study wavy annular flows. The LFT sensor consists of a matrix of electrodes put flush to the surface of the wall at which the liquid film of interest is present. The conductance between transmitter and receiver electrodes is sampled and converted into a film thickness using a calibration function obtained for a flat liquid film without waves. Due to limited lateral resolution and non-linear sensor response, waves are characterized with measuring errors, which depend on the wave height, length and angle of attack. The paper presents the result of potential field simulations of waves passing over the sensor surface. The wave parameters obtained from the simulated sensor signals are compared to the input. The results are used to quantify the uncertainty of dynamic film thickness measurements. The obtained detailed information on the sensor response allows a better interpretation of experimental results. Show more
Permanent link
https://doi.org/10.3929/ethz-b-000488159Publication status
publishedExternal links
Journal / series
Nuclear Engineering and DesignVolume
Pages / Article No.
Publisher
ElsevierSubject
Annular flow; Liquid film; Liquid film thickness sensor; Signal processing; Disturbance waves; Ripple waves; Potential field simulationsOrganisational unit
03725 - Prasser, Horst-Michael (emeritus) / Prasser, Horst-Michael (emeritus)
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Is new version of: http://hdl.handle.net/20.500.11850/393760
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