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dc.contributor.author
Güngör, Arif
dc.contributor.author
Ehrengruber, Till
dc.contributor.author
Smajic, Jasmin
dc.contributor.author
Leuthold, Juerg
dc.date.accessioned
2021-06-07T13:33:03Z
dc.date.available
2021-06-05T02:29:47Z
dc.date.available
2021-06-07T13:33:03Z
dc.date.issued
2021-06
dc.identifier.issn
0018-9464
dc.identifier.issn
1941-0069
dc.identifier.other
10.1109/TMAG.2021.3058578
en_US
dc.identifier.uri
http://hdl.handle.net/20.500.11850/488389
dc.description.abstract
A hydrodynamic model (HDM) solver based on discontinuous Galerkin time domain finite element method (DGTD-FEM) has been developed in order to simulate the transient charge transport in semiconductors. The bipolar transport equations have been numerically solved together with the Poisson equation to realize ballistic charge transport in semiconductor devices. Furthermore, the developed solver is coupled with an FEM-based full-wave Maxwell solver in order to model the behavior of semiconductors under external electromagnetic illumination. This multiphysics coupled solver is capable of simulating transient behavior of photoactive semiconductor devices that are illuminated by externally modulated light at high frequencies. With the time domain HDM solver, the inertia effects and ballistic transport are also accounted in the accurate transient simulations of high-frequency photoactive devices.
en_US
dc.language.iso
en
en_US
dc.publisher
IEEE
en_US
dc.title
Coupled Electromagnetic and Hydrodynamic Modeling for Semiconductors Using DGTD
en_US
dc.type
Journal Article
dc.date.published
2021-02-10
ethz.journal.title
IEEE Transactions on Magnetics
ethz.journal.volume
57
en_US
ethz.journal.issue
6
en_US
ethz.journal.abbreviated
IEEE Trans. Magn.
ethz.pages.start
9351969
en_US
ethz.size
5 p.
en_US
ethz.grant
Microwave Microscopy for Advanced and Efficient Materials Analysis and Production
en_US
ethz.identifier.wos
ethz.identifier.scopus
ethz.publication.status
published
en_US
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::02635 - Institut für Elektromagnetische Felder / Institute of Electromagnetic Fields::03974 - Leuthold, Juerg / Leuthold, Juerg
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::02635 - Institut für Elektromagnetische Felder / Institute of Electromagnetic Fields
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::02635 - Institut für Elektromagnetische Felder / Institute of Electromagnetic Fields
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::02635 - Institut für Elektromagnetische Felder / Institute of Electromagnetic Fields::03974 - Leuthold, Juerg / Leuthold, Juerg
ethz.grant.agreementno
761036
ethz.grant.agreementno
761036
ethz.grant.fundername
EC
ethz.grant.fundername
EC
ethz.grant.funderDoi
10.13039/501100000780
ethz.grant.funderDoi
10.13039/501100000780
ethz.grant.program
H2020
ethz.grant.program
H2020
ethz.date.deposited
2021-06-05T02:29:53Z
ethz.source
SCOPUS
ethz.eth
yes
en_US
ethz.availability
Metadata only
en_US
ethz.rosetta.installDate
2021-06-07T13:33:23Z
ethz.rosetta.lastUpdated
2024-02-02T13:52:45Z
ethz.rosetta.exportRequired
true
ethz.rosetta.versionExported
true
ethz.COinS
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