Structure of disordered materials under ambient to extreme conditions revealed by synchrotron x-ray diffraction techniques at SPring-8—recent instrumentation and synergic collaboration with modelling and topological analyses
Open access
Date
2021-09-22Type
- Review Article
Abstract
The structure of disordered materials is still not well understood because of insufficient experimental data. Indeed, diffraction patterns from disordered materials are very broad and can be described only in pairwise correlations because of the absence of translational symmetry. Brilliant hard x-rays from third-generation synchrotron radiation sources enable us to obtain high-quality diffraction data for disordered materials from ambient to high temperature and high pressure, which has significantly improved our grasp of the nature of order in disordered materials. Here, we introduce the progress in the instrumentation for hard x-ray beamlines at SPring-8 over the last 20 years with associated results and advanced data analysis techniques to understand the topology in disordered materials. Show more
Permanent link
https://doi.org/10.3929/ethz-b-000497102Publication status
publishedExternal links
Journal / series
Journal of Physics: Condensed MatterVolume
Pages / Article No.
Publisher
The Electrochemical SocietySubject
Glass; Liquid; X-ray diffraction; StructureOrganisational unit
09495 - Murakami, Motohiko / Murakami, Motohiko
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