Ion Beam Preparation Procedures for Three-dimensional SEM Resolved Kikuchi (EBSD) and Kossel Microdiffraction Analysis of Deformed Metals

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Author
Hauffe, W.
Simons, G.
Kunze, Karstencc
Langer, E.
Mitro, R.J.
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Date
2005
Type
    Conference Paper
Publication status
published
External links
Journal / series
Microscopy and Microanalysis
Volume
11(S02)
Pages / Article No.
840 - 841
Publisher
Cambridge University Press
Event
63rd Annual Meeting of the Microscopy Society of America, July 31 - August 4, 2005
Organisational unit
03392 - Burg, Jean-Pierre (emeritus)  
03307 - Dual, Jürg (emeritus) / Dual, Jürg (emeritus)  
Notes
Published online 1 August 2005.
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