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dc.contributor.author
Döbeli, M.
dc.contributor.author
Kottler, C.
dc.contributor.author
Stocker, M.
dc.contributor.author
Weinmann, S.
dc.contributor.author
Synal, Hans-Arno
dc.contributor.author
Grajcar, M.
dc.contributor.author
Suter, M.
dc.date.accessioned
2017-06-10T01:45:12Z
dc.date.available
2017-06-10T01:45:12Z
dc.date.issued
2004-06
dc.identifier.issn
0168-9002
dc.identifier.issn
1872-9576
dc.identifier.other
10.1016/j.nimb.2004.01.093
dc.identifier.uri
http://hdl.handle.net/20.500.11850/50457
dc.language.iso
en
dc.publisher
Elsevier
dc.subject
Silicon nitride
dc.subject
Membranes
dc.subject
Gas ionization detectors
dc.subject
AMS
dc.title
Gas ionization chambers with silicon nitride windows for the detection and identification of low energy ions
dc.type
Journal Article
ethz.journal.title
Nuclear instruments & methods in physics research
ethz.journal.volume
219-220
ethz.journal.abbreviated
Nucl. instrum. methods phys. res., Sect. A, Accel. spectrom. det
ethz.pages.start
415
ethz.pages.end
419
ethz.event
16th International Conference on Ion Beam Analysis
ethz.event.location
Albuquerque, NM, USA
ethz.event.date
June 29-July 4, 2003
ethz.notes
Available online 19 February 2004.
ethz.identifier.wos
ethz.identifier.nebis
000029140
ethz.publication.place
Amsterdam
ethz.publication.status
published
ethz.date.deposited
2017-06-10T01:48:03Z
ethz.source
ECIT
ethz.identifier.importid
imp59364f538809b44412
ethz.ecitpid
pub:82568
ethz.eth
yes
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-07-15T02:04:41Z
ethz.rosetta.lastUpdated
2018-08-02T09:46:22Z
ethz.rosetta.versionExported
true
ethz.COinS
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