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dc.contributor.author
Race, Salvatore
dc.contributor.author
Ziemann, Thomas
dc.contributor.author
Kovacevic-Badstuebner, Ivana
dc.contributor.author
Stark, Roger
dc.contributor.author
Tiwari, Shweta
dc.contributor.author
Grossner, Ulrike
dc.date.accessioned
2021-09-16T05:59:36Z
dc.date.available
2021-09-16T05:59:36Z
dc.date.issued
2021
dc.identifier.isbn
978-4-88686-422-2
en_US
dc.identifier.isbn
978-1-7281-8985-7
en_US
dc.identifier.other
10.23919/ISPSD50666.2021.9452198
en_US
dc.identifier.uri
http://hdl.handle.net/20.500.11850/505686
dc.description.abstract
The variability of the temperature-dependent on-state resistance, RdsON(T), of SiC power MOSFETs can significantly affect the temperature distribution, and, hence, the lifetime of SiC-multi-chip power modules. This work investigates the impact of the RdsON(T) variability on the temperature distribution within a half-bridge power module designed in-house. The actual temperature of the individual dies obtained from IR camera measurements is compared with the virtual junction temperatures measured via temperature sensitive electrical parameter for both the low side and high side topological switches. The experimental results are validated using an electrothermal modeling approach, taking into account the variability of RdsON(T), threshold voltage, and body-diode.
en_US
dc.language.iso
en
en_US
dc.publisher
IEEE
en_US
dc.title
Design for Reliability of SiC Multichip Power Modules: The Effect of Variability
en_US
dc.type
Conference Paper
dc.date.published
2021-06-15
ethz.book.title
2021 33rd International Symposium on Power Semiconductor Devices and ICs (ISPSD)
en_US
ethz.pages.start
399
en_US
ethz.pages.end
402
en_US
ethz.event
33rd International Symposium on Power Semiconductor Devices and ICs (ISPSD 2021)
en_US
ethz.event.location
Online
en_US
ethz.event.date
May 30 - June 3, 2021
en_US
ethz.identifier.wos
ethz.identifier.scopus
ethz.publication.place
Piscataway, NJ
en_US
ethz.publication.status
published
en_US
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::09480 - Grossner, Ulrike / Grossner, Ulrike
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::09480 - Grossner, Ulrike / Grossner, Ulrike
ethz.date.deposited
2021-08-22T02:46:35Z
ethz.source
WOS
ethz.source
SCOPUS
ethz.eth
yes
en_US
ethz.availability
Metadata only
en_US
ethz.rosetta.installDate
2021-09-16T05:59:44Z
ethz.rosetta.lastUpdated
2022-03-29T11:55:50Z
ethz.rosetta.versionExported
true
dc.identifier.olduri
http://hdl.handle.net/20.500.11850/505542
dc.identifier.olduri
http://hdl.handle.net/20.500.11850/501698
ethz.COinS
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