Identification and open-loop tracking control of a piezoelectric tube, scanner for high-speed scanning-probe microscopy
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Date
2004-05Type
- Journal Article
ETH Bibliography
yes
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Publication status
publishedExternal links
Journal / series
IEEE Transactions on Control Systems TechnologyVolume
Pages / Article No.
Publisher
IEEESubject
Atomic force microscopy; Fast scanning; Friction force; Piezoelectric transducers; Scanning probe; Tracking controlOrganisational unit
03444 - Stemmer, Andreas (emeritus) / Stemmer, Andreas (emeritus)
Notes
Published online 4 May 2004.More
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ETH Bibliography
yes
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