Show simple item record

dc.contributor.author
Schitter, G
dc.contributor.author
Stemmer, A.
dc.date.accessioned
2017-06-10T01:55:34Z
dc.date.available
2017-06-10T01:55:34Z
dc.date.issued
2004-05
dc.identifier.issn
1063-6536
dc.identifier.issn
1558-0865
dc.identifier.other
10.1109/TCST.2004.824290
dc.identifier.uri
http://hdl.handle.net/20.500.11850/50757
dc.language.iso
en
dc.publisher
IEEE
dc.subject
Atomic force microscopy
dc.subject
Fast scanning
dc.subject
Friction force
dc.subject
Piezoelectric transducers
dc.subject
Scanning probe
dc.subject
Tracking control
dc.title
Identification and open-loop tracking control of a piezoelectric tube, scanner for high-speed scanning-probe microscopy
dc.type
Journal Article
ethz.journal.title
IEEE Transactions on Control Systems Technology
ethz.journal.volume
12
ethz.journal.issue
3
ethz.journal.abbreviated
IEEE trans. control syst. technol.
ethz.pages.start
449
ethz.pages.end
454
ethz.notes
Published online 4 May 2004.
ethz.identifier.wos
ethz.identifier.nebis
000700836
ethz.publication.place
New York
ethz.publication.status
published
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02130 - Dep. Maschinenbau und Verfahrenstechnik / Dep. of Mechanical and Process Eng.::03444 - Stemmer, Andreas / Stemmer, Andreas
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02130 - Dep. Maschinenbau und Verfahrenstechnik / Dep. of Mechanical and Process Eng.::03444 - Stemmer, Andreas / Stemmer, Andreas
ethz.date.deposited
2017-06-10T01:56:10Z
ethz.source
ECIT
ethz.identifier.importid
imp59364f59dcdad30884
ethz.ecitpid
pub:82871
ethz.eth
yes
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-07-15T09:32:25Z
ethz.rosetta.lastUpdated
2022-03-28T10:43:49Z
ethz.rosetta.versionExported
true
ethz.COinS
ctx_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.atitle=Identification%20and%20open-loop%20tracking%20control%20of%20a%20piezoelectric%20tube,%20scanner%20for%20high-speed%20scanning-probe%20microscopy&rft.jtitle=IEEE%20Transactions%20on%20Control%20Systems%20Technology&rft.date=2004-05&rft.volume=12&rft.issue=3&rft.spage=449&rft.epage=454&rft.issn=1063-6536&1558-0865&rft.au=Schitter,%20G&Stemmer,%20A.&rft.genre=article&rft_id=info:doi/10.1109/TCST.2004.824290&
 Search print copy at ETH Library

Files in this item

FilesSizeFormatOpen in viewer

There are no files associated with this item.

Publication type

Show simple item record