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dc.contributor.author
Schor, Lars
dc.contributor.author
Bacivarov, Iuliana
dc.contributor.author
Yang, Hoeseok
dc.contributor.author
Thiele, Lothar
dc.date.accessioned
2017-06-10T01:58:19Z
dc.date.available
2017-06-10T01:58:19Z
dc.date.issued
2012
dc.identifier.isbn
978-1-4673-2355-0
dc.identifier.other
10.1109/LATW.2012.6261246
dc.identifier.uri
http://hdl.handle.net/20.500.11850/50914
dc.language.iso
en
dc.publisher
IEEE
dc.subject
Real-time systems
dc.subject
Multi-core systems
dc.subject
Compositional analysis
dc.subject
Worst-case peak temperature
dc.subject
Thermal analysis
dc.title
Fast Worst-Case Peak Temperature Evaluation for Real-Time Applications on Multi-Core Systems
dc.type
Other Conference Item
ethz.book.title
Proceedings IEEE 13th Latin American Test Workshop (LATW)
ethz.pages.start
6 p.
ethz.event
13th Latin American Test Workshop (LATW 2012)
ethz.event.location
Quito, Ecuador
ethz.event.date
April 10-13, 2012
ethz.notes
Conference lecture on 12 April 2012.
ethz.publication.place
Piscataway, NJ
ethz.publication.status
published
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::02640 - Inst. f. Technische Informatik und Komm. / Computer Eng. and Networks Lab.::03429 - Thiele, Lothar / Thiele, Lothar
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::02640 - Inst. f. Technische Informatik und Komm. / Computer Eng. and Networks Lab.::03429 - Thiele, Lothar / Thiele, Lothar
ethz.date.deposited
2017-06-10T01:58:33Z
ethz.source
ECIT
ethz.identifier.importid
imp59364f5d4aed481319
ethz.ecitpid
pub:83137
ethz.eth
yes
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-07-31T13:57:43Z
ethz.rosetta.lastUpdated
2018-10-01T17:22:28Z
ethz.rosetta.versionExported
true
ethz.COinS
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