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dc.contributor.author
Vogelsang, R.
dc.date.accessioned
2017-06-10T03:18:17Z
dc.date.available
2017-06-10T03:18:17Z
dc.date.issued
2003
dc.identifier.isbn
0-7803-7910-1
dc.identifier.other
10.1109/CEIDP.2003.1254940
dc.identifier.uri
http://hdl.handle.net/20.500.11850/52904
dc.language.iso
en
dc.publisher
IEEE Operations Center
dc.title
How imperfections in mica tape barriers influence tree growth and breakdown time
dc.type
Conference Paper
ethz.book.title
2003 annual report / Conference on Electrical Insulation and Dielectric Phenomena
ethz.pages.start
657
ethz.pages.end
660
ethz.event
Annual Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)
ethz.event.location
Albuquerque, NM, USA
ethz.event.date
October 19-22, 2003
ethz.notes
.
ethz.identifier.wos
ethz.identifier.nebis
004654779
ethz.publication.place
Piscataway, NJ
ethz.publication.status
published
ethz.date.deposited
2017-06-10T03:18:53Z
ethz.source
ECIT
ethz.identifier.importid
imp59364f87b900884870
ethz.ecitpid
pub:85771
ethz.eth
yes
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-07-12T16:55:14Z
ethz.rosetta.lastUpdated
2017-07-12T16:55:14Z
ethz.rosetta.versionExported
true
ethz.COinS
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