Application of the white/monochromatic X-ray µ-diffraction technique to the study of texture and triaxial strain at the submicron level

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Author
Goudeau, P.
Tamura, N.
Spolenak, R.
Padmore, H.A.
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Date
2005
Type
  • Conference Paper
Publication status
published
External links
Full text via SFX
Editor
Denis, Sabine
Book title
Residual stresses VII : ICRS 7 : proceedings of the 7th International Conference on Residual Stresses, ICRS-7, Xi’an, China, 14-17 June 2004
Journal / series
Materials science forum
Volume
490-491
Pages
672 - 677
Publisher
Trans Tech
Event
7th International Conference on Residual Stresses, ICRS-7, June 14-17, 2004
Subject
X-ray diffraction; synchrotron radiation; microfocus; residual stresses; texture; microstructure; thin films
Organisational unit
03692 - Spolenak, Ralph
Notes
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