Application of the white/monochromatic X-ray µ-diffraction technique to the study of texture and triaxial strain at the submicron level
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Date
2005Type
- Conference Paper
ETH Bibliography
yes
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Publication status
publishedExternal links
Editor
Book title
Residual stresses VII : ICRS 7 : proceedings of the 7th International Conference on Residual Stresses, ICRS-7, Xi’an, China, 14-17 June 2004Journal / series
Materials Science ForumVolume
Pages / Article No.
Publisher
Trans TechEvent
Subject
X-ray diffraction; synchrotron radiation; microfocus; residual stresses; texture; microstructure; thin filmsOrganisational unit
03692 - Spolenak, Ralph / Spolenak, Ralph
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ETH Bibliography
yes
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