Application of the white/monochromatic X-ray µ-diffraction technique to the study of texture and triaxial strain at the submicron level

Thumbnail
Metadata only
Author
Goudeau, P.
Tamura, N.
Spolenak, R.
Padmore, H.A.
Show all
Date
2005
Type
  • Conference Paper
Publication status
published
External links
Search via SFX
Editor
Denis, Sabine
Book title
Residual stresses VII : ICRS 7 : proceedings of the 7th International Conference on Residual Stresses, ICRS-7, Xi’an, China, 14-17 June 2004
Journal / series
Materials Science Forum
Volume
490-491
Pages / Article No.
672 - 677
Publisher
Trans Tech
Event
7th International Conference on Residual Stresses, ICRS-7, June 14-17, 2004
Subject
X-ray diffraction; synchrotron radiation; microfocus; residual stresses; texture; microstructure; thin films
Organisational unit
03692 - Spolenak, Ralph / Spolenak, Ralph  
More
Show all metadata
Citations
Cited 1 times in Web of Science
ETH Bibliography
yes
Altmetrics