Application of the white/monochromatic X-ray µ-diffraction technique to the study of texture and triaxial strain at the submicron level
dc.contributor.author
Goudeau, P.
dc.contributor.author
Tamura, N.
dc.contributor.author
Spolenak, R.
dc.contributor.author
Padmore, H.A.
dc.contributor.editor
Denis, Sabine
dc.date.accessioned
2017-06-10T03:25:41Z
dc.date.available
2017-06-10T03:25:41Z
dc.date.issued
2005
dc.identifier.isbn
0-87849-969-5
dc.identifier.issn
0255-5476
dc.identifier.issn
1662-9752
dc.identifier.other
10.4028/www.scientific.net/MSF.490-491.672
dc.identifier.uri
http://hdl.handle.net/20.500.11850/53045
dc.language.iso
en
dc.publisher
Trans Tech
dc.subject
X-ray diffraction
dc.subject
synchrotron radiation
dc.subject
microfocus
dc.subject
residual stresses
dc.subject
texture
dc.subject
microstructure
dc.subject
thin films
dc.title
Application of the white/monochromatic X-ray µ-diffraction technique to the study of texture and triaxial strain at the submicron level
dc.type
Conference Paper
ethz.book.title
Residual stresses VII : ICRS 7 : proceedings of the 7th International Conference on Residual Stresses, ICRS-7, Xi’an, China, 14-17 June 2004
ethz.journal.title
Materials Science Forum
ethz.journal.volume
490-491
ethz.pages.start
672
ethz.pages.end
677
ethz.event
7th International Conference on Residual Stresses, ICRS-7
ethz.event.date
June 14-17, 2004
ethz.identifier.nebis
004990776
ethz.publication.place
Uetikon
ethz.publication.status
published
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02160 - Dep. Materialwissenschaft / Dep. of Materials::02645 - Institut für Metallforschung / Institute of Metals Research::03692 - Spolenak, Ralph / Spolenak, Ralph
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02160 - Dep. Materialwissenschaft / Dep. of Materials::02645 - Institut für Metallforschung / Institute of Metals Research::03692 - Spolenak, Ralph / Spolenak, Ralph
ethz.date.deposited
2017-06-10T03:28:23Z
ethz.source
ECIT
ethz.identifier.importid
imp59364f8abb16e64537
ethz.ecitpid
pub:85915
ethz.eth
yes
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-07-14T15:23:46Z
ethz.rosetta.lastUpdated
2018-10-01T17:47:08Z
ethz.rosetta.versionExported
true
ethz.COinS
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