Electron energy analysis in Scanning Field Emission Microscopy using a Bessel box energy analyzer

Abstract

In this study, we use Scanning Field Emission Microscopy (SFEM) combined with a miniature electron energy analyzer known as a Bessel box to measure electron energy spectra emitted from a sample. Previous studies using SFEM have revealed that the work function (ϕ) of the material under study has a significant role to play in the formation of the signal intensity. Hence, in order to understand the role of ϕ in greater detail, a sample of W(110) (ϕ = 5.25 eV) and a sample of Cs deposited on W(110) (ϕ ≈ 1.7 eV) were investigated. STM images show that the Cs covered surface has a speckled appearance indicating small Cs islands. The electron energy loss spectra obtained (which are the first using the Bessel box in SFEM) show differing structure in the elastic peak region. Monte Carlo (MC) simulations including quantum mechanical "bouncing" have been carried out. The results are consistent with MC simulations of the electrons escaping from the tip-sample junction.