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dc.contributor.author
Bodik, Michal
dc.contributor.author
Demydenko, Maksym
dc.contributor.author
Walker, Chris G.H.
dc.contributor.author
Bähler, Thomas
dc.contributor.author
Michlmayr, Thomas
dc.contributor.author
Thamm, Ann-Katrin
dc.contributor.author
Ramsperger, Urs
dc.contributor.author
Pratt, Andrew
dc.contributor.author
Tear, Steve P.
dc.contributor.author
El-Gomati, Mohamed M.
dc.contributor.author
Pescia, Danilo
dc.date.accessioned
2022-02-11T07:25:41Z
dc.date.available
2022-02-11T07:25:41Z
dc.date.issued
2021
dc.identifier.isbn
978-1-6654-2589-6
en_US
dc.identifier.isbn
978-1-6654-2590-2
en_US
dc.identifier.other
10.1109/ivnc52431.2021.9600768
en_US
dc.identifier.uri
http://hdl.handle.net/20.500.11850/532139
dc.description.abstract
In this study, we use Scanning Field Emission Microscopy (SFEM) combined with a miniature electron energy analyzer known as a Bessel box to measure electron energy spectra emitted from a sample. Previous studies using SFEM have revealed that the work function (ϕ) of the material under study has a significant role to play in the formation of the signal intensity. Hence, in order to understand the role of ϕ in greater detail, a sample of W(110) (ϕ = 5.25 eV) and a sample of Cs deposited on W(110) (ϕ ≈ 1.7 eV) were investigated. STM images show that the Cs covered surface has a speckled appearance indicating small Cs islands. The electron energy loss spectra obtained (which are the first using the Bessel box in SFEM) show differing structure in the elastic peak region. Monte Carlo (MC) simulations including quantum mechanical "bouncing" have been carried out. The results are consistent with MC simulations of the electrons escaping from the tip-sample junction.
en_US
dc.language.iso
en
en_US
dc.publisher
IEEE
en_US
dc.subject
Field Emission
en_US
dc.subject
Tungsten
en_US
dc.subject
Cesium
en_US
dc.subject
STM
en_US
dc.subject
EELS
en_US
dc.subject
Work Function
en_US
dc.title
Electron energy analysis in Scanning Field Emission Microscopy using a Bessel box energy analyzer
en_US
dc.type
Conference Paper
dc.date.published
2021-11-17
ethz.pages.start
128
ethz.pages.end
129
ethz.event
34th International Vacuum Nanoelectronics Conference (IVNC 2021)
en_US
ethz.event.location
Online
en_US
ethz.event.date
July 5-9 2021
en_US
ethz.grant
Sources, Interaction with Matter, Detection and Analysis of Low Energy Electrons 2
en_US
ethz.identifier.wos
ethz.publication.place
Piscataway, NJ
ethz.publication.status
published
en_US
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02010 - Dep. Physik / Dep. of Physics::02505 - Laboratorium für Festkörperphysik / Laboratory for Solid State Physics::03351 - Pescia, Danilo (emeritus) / Pescia, Danilo (emeritus)
en_US
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02010 - Dep. Physik / Dep. of Physics::02505 - Laboratorium für Festkörperphysik / Laboratory for Solid State Physics::03351 - Pescia, Danilo (emeritus) / Pescia, Danilo (emeritus)
en_US
ethz.grant.agreementno
606988
ethz.grant.agreementno
606988
ethz.grant.agreementno
606988
ethz.grant.agreementno
606988
ethz.grant.fundername
EC
ethz.grant.fundername
EC
ethz.grant.fundername
EC
ethz.grant.fundername
EC
ethz.grant.funderDoi
10.13039/501100000780
ethz.grant.funderDoi
10.13039/501100000780
ethz.grant.funderDoi
10.13039/501100000780
ethz.grant.funderDoi
10.13039/501100000780
ethz.grant.program
FP7
ethz.grant.program
FP7
ethz.grant.program
FP7
ethz.grant.program
FP7
ethz.date.deposited
2022-01-21T09:11:17Z
ethz.source
WOS
ethz.source
FORM
ethz.eth
yes
en_US
ethz.availability
Metadata only
en_US
ethz.rosetta.installDate
2022-02-11T07:25:50Z
ethz.rosetta.lastUpdated
2024-02-02T16:18:33Z
ethz.rosetta.exportRequired
true
ethz.rosetta.versionExported
true
dc.identifier.olduri
http://hdl.handle.net/20.500.11850/530585
dc.identifier.olduri
http://hdl.handle.net/20.500.11850/527424
ethz.COinS
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