Improving the quality of meshes for the simulation of semiconductor devices using Lepp-based algorithms
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Date
2003-09Type
- Journal Article
Publication status
publishedExternal links
Journal / series
International Journal for Numerical Methods in EngineeringVolume
Pages / Article No.
Publisher
Wiley-BlackwellSubject
Delaunay meshes; Non-obtuse boundary meshes; Lepp-based algorithms; Control volume method; Semiconductor device simulationOrganisational unit
03228 - Fichtner, Wolfgang
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