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dc.contributor.author
Hitschfeld, Nancy
dc.contributor.author
Villablanca, Luis
dc.contributor.author
Krause, Jens
dc.contributor.author
Rivara, María C.
dc.date.accessioned
2019-02-15T13:22:24Z
dc.date.available
2017-06-10T07:42:00Z
dc.date.available
2019-02-15T13:22:24Z
dc.date.issued
2003-09
dc.identifier.other
10.1002/nme.767
en_US
dc.identifier.uri
http://hdl.handle.net/20.500.11850/54066
dc.language.iso
en
en_US
dc.publisher
Wiley-Blackwell
en_US
dc.subject
Delaunay meshes
en_US
dc.subject
Non-obtuse boundary meshes
en_US
dc.subject
Lepp-based algorithms
en_US
dc.subject
Control volume method
en_US
dc.subject
Semiconductor device simulation
en_US
dc.title
Improving the quality of meshes for the simulation of semiconductor devices using Lepp-based algorithms
en_US
dc.type
Journal Article
dc.date.published
2003-07-10
ethz.journal.title
International Journal for Numerical Methods in Engineering
ethz.journal.volume
58
en_US
ethz.journal.issue
2
en_US
ethz.pages.start
333
en_US
ethz.pages.end
347
en_US
ethz.notes
en_US
ethz.identifier.wos
ethz.publication.place
London
en_US
ethz.publication.status
published
en_US
ethz.leitzahl
03228 - Fichtner, Wolfgang
en_US
ethz.leitzahl.certified
03228 - Fichtner, Wolfgang
ethz.date.deposited
2017-06-10T07:43:14Z
ethz.source
ECIT
ethz.identifier.importid
imp59364fa1d015f47325
ethz.ecitpid
pub:87391
ethz.eth
yes
en_US
ethz.availability
Metadata only
en_US
ethz.rosetta.installDate
2017-07-13T07:52:57Z
ethz.rosetta.lastUpdated
2019-02-15T13:22:30Z
ethz.rosetta.versionExported
true
ethz.COinS
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