Validation of an algorithm for wave propagation in graded materials with analytical solution

Thumbnail
Metadata only
Author
Aebi, L.
Löffel, K.
Vollmann, J.
Dual, Jürg
Show all
Date
2007
Type
  • Conference Paper
Publication status
published
External links
Search via SFX
Book title
Optical measurement systems for industrial inspection V : 18-22 June 2007, Munich, Germany
Journal / series
Proceedings of SPIE
Volume
6616
Pages / Article No.
66163F
Publisher
SPIE
Event
Optical Measurement Systems for Industrial Inspection V, Munich, Germany, June 18-22, 2007
Subject
Industrial application; Optical method; Measuring methods; Nanostructures; Numerical method; Finite difference time-domain analysis; Analytical solution; Algorithms; Theoretical study; Pulse propagation; Mechanical stress; Electromagnetic wave propagation
Organisational unit
03307 - Dual, Jürg  
Notes
.
More
Show all metadata
ETH Bibliography
yes
Altmetrics